Design for Testability (DFT) Services To Manage Chip Performance

Our focus is on simplifying and optimizing the testing process for System on Chip (SoC) designs, which have become increasingly complex due to advancements in processes, shrinking circuit sizes, and strict power consumption limits. We understand the challenges posed by modern SoC designs, which often feature multiple memory components, mixed-signal blocks, and IPs sourced from various vendors. Our DFT solutions are specific to address these complexities and streamline the testing process. Utilizing a hybrid algorithm with a balanced compression ratio scan, we consistently achieve high pattern counts while minimizing testing overhead. Our approach includes thorough testing on standalone test benches, covering diagnostic, hard repair, soft repair, and BIST verification modes before integration into the SoC. Our comprehensive DFT methodology involves seamlessly inserting test structures into designs and integrating existing test structures embedded in IP. Through automation and careful design analysis, we minimize the need for extensive modifications to the front-end design. We support a wide range of industry-standard features such as IEEE 1687 IJTAG support, 1149.1/1149.6 boundary scan, memory BIST and repair, scan stitching, scan compression, core wrapper insertion, and more. Additionally, our advanced features include MBIST wrappers and logic insertion, clock conditioning and control integration, automated logical equivalence checking, and multi-pass test pattern generation for comprehensive coverage analysis.